@inproceedings{HER24e,
title	=	{Assessing the Performance of the TOFPET2c ASIC at X-ray Energies for Time-of-Flight Scatter Rejection Applications},
year	=	{2024},
booktitle	=	{2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)},
thumbnail	=	{HER24e.png},
pages	=	{1-1},
doi	=	{10.1109/NSS/MIC/RTSD57108.2024.10658052},
keywords	=	{Radiography;Image quality;Semiconductor device measurement;Microwave integrated circuits;Sensitivity;Semiconductor detectors;Computed tomography},
author	=	{Gaulin, L.-D. and Nadig, V. and Rossignol, J. and Gagnon, F. and Herweg, K. and Schulz, V. and Gundacker, S. and Fontaine, R.}}